Imaging (SEM, TEM), Surface Analysis (EDX), X-Ray Diffraction (XRD) Faculty of Engineering & Science

Imaging and Surface Analysis

Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Energy Dispersive X-ray Analysis (EDX) can be used to image and investigate the properties and compositions of a broad range of sample types.

  • High resolution surface inspection and backscatter analysis of samples
  • Non-destructive, semi-quantitative elemental analysis of solids using energy dispersive X-ray microanalysis
  • X-ray mapping, line profiles and Cameo X-ray imaging
  • Surface measurements and roughness characterisation using stereo-imaging
  • Low vacuum variable pressure for examination of uncoated material
  • Hard copy or digital export of images
  • Carbon and gold coating of non-conducting samples.

X-Ray Diffraction (XRD)

  • Powder X-ray diffraction
  • Phase identification
  • Search match and semi-quantitative analysis using Siroquant (Rietveld)
  • Characterisation and quantification of clays and other mineral phases.